Mutation Testing Author

Name: Jeffery von Ronne
Affiliation: University of Texas at San Antonio
Email: vonronne@cs.utsa.edu
Webpage: http://www.cs.utsa.edu/~vonronne
1Wei Chen and Roland H. Untch and Gregg Rothermel and Sebastian Elbaum and Jeffery von Ronne
Can Fault-Exposure-Potential Estimates Improve the Fault Detection Abilities of Test Suites?
Software Testing, Verification and Reliability, 12(4), December 2002.
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